@inproceedings{162cce129b3b4d238c2220272a34de81,
title = "Neutron beam testing of high performance computing hardware",
abstract = "Microprocessor-based systems are the most common design for high-performance computing (HPC) platforms. In these systems, several thousands of microprocessors can participate in a single calculation that could take weeks or months to complete. When used in this manner, a fault in any of the microprocessors could cause the computation to crash or cause silent data corruption (SDC), i.e. computationally incorrect results. In recent years, neutron-induced failures in HPC hardware have been observed, and researchers have started to study how neutron radiation affect microprocessor-based scientific computations. This paper presents results from an accelerated neutron test focusing on two microprocessors used in Roadrunner, the first Petaflop system.",
keywords = "Soft error, cross-section, neutron beam testing, silent data corruption, single event effect",
author = "Michalak, {Sarah E.} and DuBois, {Andrew J.} and Storlie, {Curtis B.} and Quinn, {Heather M.} and Rust, {William N.} and DuBois, {David H.} and Modl, {David G.} and Andrea Manuzzato and Blanchard, {Sean P.}",
year = "2011",
month = nov,
day = "23",
doi = "10.1109/REDW.2010.6062525",
language = "English (US)",
isbn = "9781457712838",
series = "IEEE Radiation Effects Data Workshop",
pages = "169--176",
booktitle = "2011 IEEE Radiation Effects Data Workshop, REDW 2011 - Held in Conjunction with the IEEE Nuclear and Space Radiation Effects Conference, NSREC 2011, Proceedings",
note = "2011 IEEE Radiation Effects Data Workshop, REDW 2011 - Held in Conjunction with the IEEE Nuclear and Space Radiation Effects Conference, NSREC 2011 ; Conference date: 25-07-2011 Through 29-07-2011",
}