Abstract
The design constraints encountered during the implementation of a mixed gallium arsenide/silicon ECL digital RF memory (DRFM) are described. This unit, which is configured to digitize an analog signal at 1 GHz rates, has served as a test bed for ten separate designs for the high clock rate front and back ends of the DRFM system. Preliminary test results from the GaAs components are presented and discussed.
| Original language | English (US) |
|---|---|
| Pages | 173-176 |
| Number of pages | 4 |
| State | Published - 1985 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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