Application of RHBD techniques to SEU hardening of third-generation SiGe HBT logic circuits

Ramkumar Krithivasan, Paul W. Marshall, Mustayeen Nayeem, Akil K. Sutton, Wei Min Kuo, Becca M. Haugerud, Laleh Najafizadeh, John D. Cressler, Martin A. Carts, Cheryl J. Marshall, David L. Hansen, Kay Carol M. Jobe, Anthony L. McKay, Guofu Niu, Robert Reed, Barbara A. Randall, Charles A. Burfield, Mary Daun Lindberg, Barry K. Gilbert, Erik S. Daniel

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